The paper presents results of a series of experimental and theoretical studies, performed on the interactions of electronic equipment (EE) and its component base with USPW electromagnetic radiation with the duration range 10^-10 - 10^-7. Also presented is a concept of adaptive device testing (ADT) which is designed to adequately describe the complex object response to external electromagnetic interference (EEI). Consideration is given to USPW source field coupling of a relatively narrow- and an ultra-wide band (UWB) radiation frequencies with sophisticated electronic devices. The response of common receiver-amplifier sections (RAS) in the UHF frequency range is exemplified to demonstrate a high functionally destructive USPW action, even at relatively low emission power levels. Finally, the paper investigates a possibility of RAS induced-malfunctioning owing to randomization of its internal state under the action of incident short-pulse microwave radiation, electromagnetic impulses (EMI) and combinations thereof.